20-21 April
Silicon Valley

SEMILAB provides state-of-the-art process control and metrology solutions for semiconductor device manufacturers, and is a strategic metrology supplier of leading wafer manufacturers, IC device makers in the More-than-Moore market segment, solar and display industries worldwide.
With our 48 product lines and over 300 unique products, our growing portfolio offers a comprehensive suite of optical and electrical metrology solutions designed to ensure precision, reliability, and efficiency in Material Characterization with a special focus on Si, SiC and GaN, Advanced Packaging, Panel Level Packaging and Photonics.
LST is industry standard for monitoring and analysis of bulk microdefects, while the Semilab AFM enables nanoscale surface roughness monitoring and defect review of Si, SiC, GaN samples. PMR monitors various ion-implant parameters by Si and SiC wafer production. EIR is designed for epi thickness characterization. uSE offers high-throughput thin film characterization. En-Vision targets non-destructive detection of buried defects.
With our 1600 employees worldwide, together we participate in the entire manufacturing process of measuring instruments from the first spark of idea to the last test-run before delivering the product to the customer.
Semilab covers the entire R&D lifecycle of product innovation, from research, metrology development and manufacturing to implementation, leading to more efficient production and control, while guaranteeing the highest-level user experience possible.